The coincidence site lattice and the 'sigma enigma'

被引:105
作者
Randle, V [1 ]
机构
[1] Univ Coll Swansea, Dept Mat Engn, Swansea SA2 8PP, W Glam, Wales
关键词
CSL; EBSD; grain boundary plane;
D O I
10.1016/S1044-5803(02)00193-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper focuses on the most appropriate use of electron back-scatter diffraction (EBSD) post-acquisition analysis for categorisation of grain boundaries in polycrystals. A brief survey of the early literature shows that the most meaningful reference structure for grain boundaries in polycrystals is periodicity in the grain boundary surface, rather than the misorientation-based coincidence site lattice (CSL) and Sigma notation. However, use of the CSL is convenient to the experimentalist. It is therefore suggested that wherever possible, misorientation data, obtained by EBSD mapping and classified according to CSL types, should be supplemented with other, more detailed information to aid analysis. (C) 2001 Elsevier Science Inc. All rights reserved.
引用
收藏
页码:411 / 416
页数:6
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