The effective charge in surface electromigration

被引：50

作者：

Fu, ES

Liu, DJ

Johnson, MD

Weeks, JD

Williams, ED

机构：

[1] UNIV MARYLAND,DEPT PHYS,COLLEGE PK,MD 20742

[2] UNIV MARYLAND,INST PHYS SCI & TECHNOL,COLLEGE PK,MD 20742

来源：

SURFACE SCIENCE | 1997年 / 385卷 / 2-3期

关键词：

diffusion and migration; models of non-equilibrium phenomena; scanning tunneling microscopy; semiconducting surfaces; silicon; stepped single crystal surfaces; surface structure; morphology; roughness; and topography;

D O I：

10.1016/S0039-6028(97)00188-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The rate of thermal decay of a metastable sawtooth morphology on Si(111) is greatly accelerated by the application of a bulk direct current in the ''uphill'' direction. STM measurements of the rate are compared with a mesoscopic theory of surface mass transport incorporating an effective surface electromigration force on the diffusing species. Quantitative agreement with the experimental observations is obtained for an effective charge less than or equal to 0.01 electron charge at 900 degrees C. (C) 1997 Elsevier Science B.V.

引用

页码：259 / 269

页数：11

共 32 条

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