Fine crystal lattice fringes observed using a transmission electron microscope with 1 MeV coherent electron waves

被引：63

作者：

Kawasaki, T ^{[1
]}

Yoshida, T

Matsuda, T

Osakabe, N

Tonomura, A

Matsui, I

Kitazawa, K

机构：

[1] Hitachi Ltd, Adv Res Lab, Hatoyama, Saitama 3500395, Japan

[2] Japan Sci & Technol Corp, CREST, Kawaguchi, Saitama 3320012, Japan

[3] Hitachi Ltd Instruments, Katsuta, Ibaraki 3120033, Japan

[4] Univ Tokyo, Dept Appl Chem, Tokyo 1138656, Japan

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 10期

关键词：

D O I：

10.1063/1.126028

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A transmission electron microscope with a 1 MeV cold field-emission electron source has been developed for coherent and penetrating electron waves. We confirmed the coherence and overall stability of the microscope by observing Au(33(7) over bar) lattice fringes. These fringes have a 0.498 Angstrom spacing. (C) 2000 American Institute of Physics. [S0003-6951(00)01110-4].

引用

页码：1342 / 1344

页数：3

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