Thickness dependence of the superconducting transition temperature of La2-xSrxCuO4 films

被引:23
作者
Chen, XJ
Lin, HQ [1 ]
Gong, CD
机构
[1] Chinese Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
[2] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
来源
PHYSICAL REVIEW B | 2000年 / 61卷 / 14期
关键词
D O I
10.1103/PhysRevB.61.9782
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A model of the strain effect on the transition temperature T-c of superconducting films is presented. Details are given for previously published results on the thickness dependence of T-c in the (001) La1.85Sr0.15CuO4 films. A key role is played by the strain resulting From lattice mismatch between the film and the substrate, which is responsible for the behavior of T-c. Calculations show that the values of T-c of the films on SrLaAlO4 substrates under compressive strain are always higher than those on SrTiO3 under tensile strain. As the thickness is reduced, the films grown on SrTiO3 substrates exhibit a rapid reduction of T-c, whereas the T-c increases on SrLaAlO4 substrates. The theoretical results are in good agreement with experiments.
引用
收藏
页码:9782 / 9785
页数:4
相关论文
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