In-situ investigation of patterned magnetic domain structures using magnetic force microscope

被引：5

作者：

Wu, JC ^{[1
]}

Huang, HW

Huang, YW

Wu, TH

机构：

[1] Natl Changhua Univ Educ, Dept Phys, Changsha 500, Peoples R China

[2] Natl Yunlin Univ Sci & Technol, Dept Humanitiites & Sci, Touliu, Yunlin, Taiwan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1999年 / 35卷 / 05期

关键词：

electron beam lithography; magnetic domain structures; magnetic force microscope;

D O I：

10.1109/20.800564

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel method for in-situ investigation of patterned magnetic domain structures is presented. Micron-length scales of permalloy thin film fabricated by a lift-off process using electron beam lithography were placed on the top and adjacent to an Aluminum strip. A magnetic force microscope was used to take continuous images of the patterned permalloy films while an electrical current was applied in the aluminum strip, with which a magnetic field was established through the patterned permalloy films in the perpendicular and plane direction. As a result, changes of the magnetic domain structures were observed in the presence of the applied magnetic field.

引用

页码：3481 / 3483

页数：3

共 6 条

[1] Field-dependence of microscopic probes in magnetic force microscopy [J].

Babcock, KL ;

Elings, VB ;

Shi, J ;

Awschalom, DD ;

Dugas, M .

APPLIED PHYSICS LETTERS, 1996, 69 (05) :705-707

[2] Magnetization reversal processes of NiFe elements exchange coupled by NiO antiferromagnetic films [J].

Ding, J ;

Zhu, JG .

JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :5892-5894

[3] Domain wall motion in micron-sized permalloy elements [J].

Gomez, RD ;

Luu, TV ;

Pak, AO ;

Mayergoyz, ID ;

Kirk, KJ ;

Chapman, JN .

JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) :4598-4600

[4] Domain configurations of nanostructured Permalloy elements [J].

Gomez, RD ;

Luu, TV ;

Pak, AO ;

Kirk, KJ ;

Chapman, JN .

JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) :6163-6165

[5] Quantification of magnetic force microscopy using a micronscale current ring [J].

Kong, LS ;

Chou, SY .

APPLIED PHYSICS LETTERS, 1997, 70 (15) :2043-2045

[6] In-situ magnetoresistance measurements on spin valve elements combined with Lorentz transmission electron microscopy [J].

Portier, X ;

PetfordLong, AK ;

Doole, RC ;

Anthony, TC ;

Brug, JA .

IEEE TRANSACTIONS ON MAGNETICS, 1997, 33 (05) :3574-3579

← 1 →