Quantitative description of phenolic polymer dissolution using the concept of gel layer

被引:6
作者
Choi, SJ [1 ]
Cho, JY [1 ]
机构
[1] DongJin Semichem Co Ltd, Elect Mat Div, Hwasung Goon 445930, Kyungki Do, South Korea
来源
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVIII, PTS 1 AND 2 | 2001年 / 4345卷
关键词
phenolic polymer; gel layer; dissolution rate; base diffusion; deprotonation; molecular weight dependency; base concentration dependency; critical minimum base concentration;
D O I
10.1117/12.436820
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
New model(1,2) using the concept of gel layer was recently presented that aimed to provide a theoretical interpretation for experimental data of dissolution behavior to control the lithographic performance of the photoresist. The dependence of the dissolution rate of phenolic polymer on the aqueous base concentration and molecular weight of resin can be analytically described by mathematical modeling considering the formation of gel layer, which is formed by the entry of aqueous base and deprotonation of some of the phenol group. The new polymer dissolution model is based on the suggested mechanism that the diffusion of base and deprotonation reaction of the phenolic group of polymer take place simultaneously through a gel layer. The fundamental equation, which is derived from the concept of gel layer, correctly fits experimental data(11) for aqueous base concentration and molecular weight dependence of dissolution rate of phenolic polymer. In addition, the model can predict the experimentally critical minimum base concentration below which dissolution is no longer observed. As a result, the mathematical expression by this approach offers a fully quantitative and analytical understanding of the dissolution rate.
引用
收藏
页码:952 / 962
页数:11
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