Current-perpendicular-to-plane-magnetoresistance properties of Ru and Co/Ru interfaces

被引：51

作者：

Eid, K ^{[1
]}

Fonck, R

Darwish, MA

Pratt, WP

Bass, J

机构：

[1] Michigan State Univ, Ctr Sensor Mat, Dept Phys & Astron, E Lansing, MI 48824 USA

[2] Michigan State Univ, Ctr Fundamental Mat Res, E Lansing, MI 48824 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2002年 / 91卷 / 10期

关键词：

D O I：

10.1063/1.1447294

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Recent interest in Ru and Co/Ru multilayers stimulated us to measure their properties in the current-perpendicular-to-plane (CPP) geometry at 4.2 K. For sputtered samples, we present results for the resistivity of Ru, the interface specific resistances of Cu/Ru and Co/Ru, the spin-memory-loss length l(sf)(Ru) in Ru, the spin-memory-loss probability at Cu/Ru interfaces, and the spin-scattering anisotropy parameter gamma at Co/Ru interfaces. (C) 2002 American Institute of Physics.

引用

页码：8102 / 8104

页数：3

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