Problems related to energy-dispersive X-ray stress analysis performed in reflection geometry

被引：3

作者：

Stock, C

Genzel, C

Reimers, W

机构：

[1] Hahn Meitner Inst Berlin GmbH, Dept Struct Res, D-1000 Berlin, Germany

[2] Tech Univ Berlin, Inst Mat Sci & Technol, D-1000 Berlin, Germany

来源：

ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES | 2002年 / 404-7卷

关键词：

energy dispersive diffraction; residual stress gradient analysis;

D O I：

10.4028/www.scientific.net/MSF.404-407.13

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Compared with the well established methods of angle dispersive X-ray stress analysis, the application of energy dispersive diffraction techniques using white radiation provides several advantages. Besides the higher penetration depths which are achieved by the higher energies, the multitude of reflections recorded in one spectrum offers additional information that can be used for stress gradient evaluation. By simulations as well as practical examples the paper is to give a survey over the problems involved in the field of depth resolved energy dispersive residual stress analysis.

引用

收藏

页码：13 / 18

页数：6

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