Characterization of fractal surfaces

被引：122

作者：

Wu, JJ ^{[1
]}

机构：

[1] Chinese Cultural Univ, Dept Engn Mech, Taipei, Taiwan

来源：

WEAR | 2000年 / 239卷 / 01期

关键词：

fractal surface; root mean square; asperity;

D O I：

10.1016/S0043-1648(99)00362-2

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 [机械工程];

摘要：

Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces. (C) 2000 Elsevier Science S.A. All rights reserved.

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页码：36 / 47

页数：12

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