New features of dislocation images in third-generation synchrotron radiation topographs

被引:15
作者
Zontone, F
Mancini, L
Barrett, R
Baruchel, J
Hartwig, J
Epelboin, Y
机构
[1] UNIV PARIS 06,LMCP,UA 009 CNRS,F-75252 PARIS 05,FRANCE
[2] UNIV D DIDEROT,F-75252 PARIS 05,FRANCE
关键词
topography; dislocations; direct images; simulations; X-ray coherence; image contrast;
D O I
10.1107/S0909049596002269
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Some aspects of the dislocation contrast observed at third-generation synchrotron radiation set-ups are presented. They can be explained by taking into account angular deviation effects on the beam propagation, which are visible because of the 'almost plane-wave' character of these sources. In particular, we show how the evolution of the direct image width of a dislocation as a function of the sample-to-film distance can allow a complete determination of the Burgers vector, i.e. in sign and modulus. In addition, experimental results obtained in monochromatic beam topography are compared with simulated images calculated assuming plane-wave illumination and are demonstrated to show a satisfactory agreement. The utility of the weak-beam technique in enhancing the spatial resolution is demonstrated and a criterion for the selection of experimental conditions depending upon the required spatial resolution, signal-to-noise ratio and exposure time is presented.
引用
收藏
页码:173 / 184
页数:12
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