Recent developments in industrial applications of elastic scatter X-ray inspection

被引：29

作者：

Luggar, RD ^{[1
]}

Gilboy, WB ^{[1
]}

机构：

[1] Univ Surrey, Dept Phys, Sch Phys Sci, Guildford GU2 5XH, Surrey, England

来源：

RADIATION PHYSICS AND CHEMISTRY | 1999年 / 56卷 / 1-2期

关键词：

X-ray; elastic scatter; diffraction; non-invasive inspection;

D O I：

10.1016/S0969-806X(99)00278-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

This article describes some recent advances in elastic X-ray scatter as a means of non-invasive industrial inspection. Elastic scatter leads directly to X-ray diffraction and is dependent upon the molecular structure of the scattering medium, This makes the technique particularly sensitive to discrimination between low-Z materials and has been exploited in such areas as the detection of "soft", or low-Z, contaminants in foodstuff, for the discrimination of oil and water and in the detection of mineral deposits. These applications are discussed together with an outline of X-ray scattering theory and an overview of the various means of exploiting elastic X-ray scatter for materials inspection and imaging. (C) 1999 Elsevier Science Ltd. All rights reserved.

引用

页码：213 / 227

页数：15

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