Dielectric constants of Ir, Ru, Pt, and IrO2:: Contributions from bound charges

被引:61
作者
Choi, W. S. [1 ]
Seo, S. S. A.
Kim, K. W.
Noh, T. W.
Kim, M. Y.
Shin, S.
机构
[1] Seoul Natl Univ, Dept Phys & Astron, ReCOE, Seoul 151747, South Korea
[2] Seoul Natl Univ, Dept Phys & Astron, FPRD, Seoul 151747, South Korea
[3] Samsung Adv Inst Technol, Suwon 440600, South Korea
关键词
D O I
10.1103/PhysRevB.74.205117
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the dielectric functions epsilon(omega) of Ir, Ru, Pt, and IrO2, which are commonly used as electrodes in ferroelectric thin-film applications. In particular, we investigated the contributions from bound charges epsilon(b)(omega), since these are important scientifically as well as technologically: the epsilon(b)(1)(0) of a metal electrode is one of the major factors determining the depolarization field inside a ferroelectric capacitor. To obtain epsilon(b)(1)(0), we measured reflectivity spectra of sputtered Pt, Ir, Ru, and IrO2 films in a wide photon energy range between 3.7 meV and 20 eV. We used a Kramers-Kronig transformation to obtain real and imaginary dielectric functions, and then used Drude-Lorentz oscillator fittings to extract epsilon(b)(1)(0) values. Ir, Ru, Pt, and IrO2 produced experimental epsilon(b)(1)(0) values of 48 +/- 10, 82 +/- 10, 58 +/- 10, and 29 +/- 5, respectively, which are in good agreement with values obtained using first-principles calculations. These values are much higher than those for noble metals such as Cu, Ag, and Au because transition metals and IrO2 have such strong d-d transitions below 2.0 eV. High epsilon(b)(1)(0) values will reduce the depolarization field in ferroelectric capacitors, making these materials good candidates for use as electrodes in ferroelectric applications.
引用
收藏
页数:8
相关论文
共 23 条
[1]   Ferroelectricity at the nanoscale: Local polarization in oxide thin films and heterostructures [J].
Ahn, CH ;
Rabe, KM ;
Triscone, JM .
SCIENCE, 2004, 303 (5657) :488-491
[2]  
ASHCROFT NW, 1976, SOLID STATE PHYS, P777
[3]   Fatigue of Pb(Zr0.53Ti0.47)O3 ferroelectric thin films [J].
Du, XF ;
Chen, IW .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (12) :7789-7798
[4]   OPTICAL PROPERTIES OF AG AND CU [J].
EHRENREICH, H ;
PHILIPP, HR .
PHYSICAL REVIEW, 1962, 128 (04) :1622-+
[5]   OPTICAL-PROPERTIES OF SINGLE-CRYSTAL RUTILE RUO2 AND IRO2 IN THE RANGE 0.5 TO 9.5 EV [J].
GOEL, AK ;
SKORINKO, G ;
POLLAK, FH .
PHYSICAL REVIEW B, 1981, 24 (12) :7342-7350
[6]  
Jellison G. E. Jr., 1992, Optical Materials, V1, P151, DOI 10.1016/0925-3467(92)90022-F
[7]  
JO JY, CONDMAT0605079
[8]   Critical thickness for ferroelectricity in perovskite ultrathin films [J].
Junquera, J ;
Ghosez, P .
NATURE, 2003, 422 (6931) :506-509
[9]   Polarization retention in Pb(Zr0.4Ti0.6)O3 capacitors with IrO2 top electrodes [J].
Kang, BS ;
Kim, DJ ;
Jo, JY ;
Noh, TW ;
Yoon, JG ;
Song, TK ;
Lee, YK ;
Lee, JK ;
Shin, S ;
Park, YS .
APPLIED PHYSICS LETTERS, 2004, 84 (16) :3127-3129
[10]   Polarization relaxation induced by a depolarization field in ultrathin ferroelectric BaTiO3 capacitors -: art. no. 237602 [J].
Kim, DJ ;
Jo, JY ;
Kim, YS ;
Chang, YJ ;
Lee, JS ;
Yoon, JG ;
Song, TK ;
Noh, TW .
PHYSICAL REVIEW LETTERS, 2005, 95 (23)