Full contrast transfer function correction in 3D Cryo-EM reconstruction

被引：16

作者：

Wan, Y ^{[1
]}

Chiu, W ^{[1
]}

Zhou, ZH ^{[1
]}

机构：

[1] Baylor Coll Med, Verna & Marrs Mclean Dept Biochem & Mol Biol, Natl Ctr Macromol Imaging, Houston, TX 77030 USA

来源：

2004 INTERNATIONAL CONFERENCE ON COMMUNICATION, CIRCUITS, AND SYSTEMS, VOLS 1 AND 2: VOL 1: COMMUNICATION THEORY AND SYSTEMS - VOL 2: SIGNAL PROCESSING, CIRCUITS AND SYSTEMS | 2004年

关键词：

electron microscopy; contrast transfer function; depth-of-field problem;

D O I：

10.1109/ICCCAS.2004.1346339

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Over the past years electron cryo-microscopy (cryo-EM) has established itself as an important tool in studying the three dimensional structure of biological molecules up to the resolution of 6-9A. However, as we pursue even higher resolution (i.e., 3-4A), the depth-of-field problem inherent in the contrast transfer function emerges as a limiting factor. This problem has been previously addressed in the research community [1]-[4]. In this paper we develop the full theoretical solution to this problem. we show that the projected image from the electron microscope corresponds to neither a slice, nor an Ewald sphere In the Fourier space, but a couple of quadratic surfaces in that space. the general solutions to this problem for both single and double defocus exposures are developed. Simulations show the correctness of the theory.

引用

页码：960 / 964

页数：5

共 6 条

[1] ESTIMATES OF VALIDITY OF PROJECTION APPROXIMATION FOR 3-DIMENSIONAL RECONSTRUCTIONS AT HIGH-RESOLUTION [J].