Method for magnetic characterization of nanowire structures

被引:40
作者
Spinu, L [1 ]
Stancu, A
Radu, C
Li, F
Wiley, JB
机构
[1] Univ New Orleans, AMRI, New Orleans, LA 70148 USA
[2] Univ New Orleans, Dept Phys, New Orleans, LA 70148 USA
[3] Alexandru Ioan Cuza Univ, Fac Phys, Iasi 700506, Romania
[4] Univ New Orleans, Dept Chem, New Orleans, LA 70148 USA
关键词
first-order reversal curves (FORC) diagram; magnetic nanowires; Preisach model;
D O I
10.1109/tmag.2004.829810
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A method for the magnetic characterization of nanowires systems is presented. It is based on first-order reversal curves (FORC) diagrams. The experimental difficulties and peculiarities of this approach when applied to nanowire systems are also described. Two samples containing approximately 20-mum-long Ni wires, either 20 or 200 nm in diameter, were measured. The FORC diagrams for these two samples are presented and the results discussed.
引用
收藏
页码:2116 / 2118
页数:3
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