Contact resistance in metal-molecule-metal junctions based on aliphatic SAMs: Effects of surface linker and metal work function

被引:356
作者
Beebe, JM
Engelkes, VB
Miller, LL
Frisbie, CD
机构
[1] Univ Minnesota, Dept Chem, Minneapolis, MN 55455 USA
[2] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
关键词
D O I
10.1021/ja0268332
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Using conducting probe atomic force microscopy (CP-AFM), we have formed molecular tunnel junctions consisting of alkanethiols and alkane isonitrile self-assembled monolayers sandwiched between gold, platinum, silver, and palladium contacts. We have measured the resistance of these junctions at low bias (dV/dI |V=0) as a function of alkane chain length. Extrapolation to zero chain length gives the contact resistance, R0 . R0 is strongly dependent on the type of metal used for the contacts and decreases with increasing metal work function; that is, R0,Ag > R0,Au > R0,pd > R0,pt. R0 is ∼ 10% smaller for Au junctions with isonitrile versus thiol surface linkers. We conclude that the Fermi level of the junction lies much closer to the HOMO than to the LUMO. Copyright © 2002 American Chemical Society.
引用
收藏
页码:11268 / 11269
页数:2
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