Self-assembling electrical connections based on the principle of minimum resistance

被引:12
作者
Dueweke, M
Dierker, U
Hubler, A
机构
[1] Center for Complex Systems Research, Department of Physics, Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL
来源
PHYSICAL REVIEW E | 1996年 / 54卷 / 01期
关键词
D O I
10.1103/PhysRevE.54.496
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
We study self-constructing and self-repairing electrical connections built by agglomeration of metallic particles between two electrodes. Our experiments show that self-assembling electrical connections grow by building a chain of particles between two electrodes immersed in a dielectric liquid. We find that the growth time for the self-assembling process is a linear function of the initial average spacing of metallic particles and a linear function of the distance between the electrodes. Furthermore, the experiments demonstrate the ability of the electrical connection to self-repair following small perturbations. We show that the agglomeration process occurs in such a way as to minimize the overall resistance of the system. We discuss possible future applications of this phenomenon for fabricating nanoscale circuits.
引用
收藏
页码:496 / 506
页数:11
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