Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy

被引：35

作者：

Kulkarni, AV ^{[1
]}

Bhushan, B ^{[1
]}

机构：

[1] OHIO STATE UNIV,DEPT MECH ENGN,COMP MICROTRIBOL & CONTAMINAT LAB,COLUMBUS,OH 43210

来源：

MATERIALS LETTERS | 1996年 / 29卷 / 4-6期

关键词：

nanoindentation; atomic force microscopy; mechanical property measurements; indentation size effects; strain-rate effects;

D O I：

10.1016/S0167-577X(96)00160-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A nanoindentation device in conjunction with a commercial AFM is used to make indentations at ultra light loads in single-crystal aluminum. The nanoindentation device has the capability to make load-displacement measurements with subnanometer indentation depth sensitivity and in-situ imaging of indentations. Indentations were made at loads ranging from 15 to 1000 mu N using a Berkovich indenter. The load-displacement data have been used to obtain indentation hardness of single-crystal aluminum. Hysteresis, creep and strain-rate sensitivity effects have also been studied.

引用

页码：221 / 227

页数：7

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