Ion beam induced luminescence of materials

被引:35
作者
Brooks, RJ [1 ]
Hole, DE [1 ]
Townsend, PD [1 ]
机构
[1] Univ Sussex, Sch Engn & Informat Technol, Brighton BN1 9QT, E Sussex, England
关键词
luminescence; ionoluminescence;
D O I
10.1016/S0168-583X(01)01226-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ion beam interactions with many insulating materials produces strong luminescence and this may be collected and analysed to gain information on the defect structures present. The use of light ions such as H+ and He- with MeV energies allows penetration to a depth of several microns in most materials. The variation of ion species and energy allows precise control of ion-induced damage and ionisation within the material. This control of depth. ionisation. and damage can be superior to that of the traditional cathodo-luminescence technique and comparison with spectra from the two methods often yields differences in sensitivity to different emission bands and features. (C) 2002 Published by Elsevier Science B.V.
引用
收藏
页码:136 / 140
页数:5
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