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Built-in-test for processor-based modules
被引：1
作者：
Ferraro, J
机构：
关键词：
D O I：
10.1109/MIM.2002.1028371
中图分类号：
TM [电工技术];
TN [电子技术、通信技术];
学科分类号：
0808 ;
0809 ;
摘要：
Built-in-test (BIT) for processor-based modules was discussed. The basic processor core remained the same even with the large number of variations in design architecture. The executive was present at the core of the system. It integrated all the component and provided the interface to outside applications and boot programs. The BIT products proved themselves to be an effective approach to module, unit and system BIT on several programs with Raytheon.
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页码：39 / 42
页数：4
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