Stability of a superconductive atom chip with persistent current

被引：26

作者：

Hufnagel, Christoph ^{[1
,2
]}

Mukai, Tetsuya ^{[1
,2
]}

Shimizu, Fujio ^{[1
,2
,3
]}

机构：

[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan

[2] Japan Sci & Technol Agcy, CREST, Kawaguchi, Saitama 3320012, Japan

[3] Univ Electrocommun, Inst Laser Sci, Tokyo 1138585, Japan

来源：

PHYSICAL REVIEW A | 2009年 / 79卷 / 05期

关键词：

high-temperature superconductors; magnesium compounds; persistent currents; rubidium; type II superconductors; BOSE-EINSTEIN CONDENSATION;

D O I：

10.1103/PhysRevA.79.053641

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The lifetime of Rb-87 atoms trapped in a z wire trap generated by a closed-circuit superconductive current on a MgB2 strip is measured as a function of the distance between the atom and the strip. The lifetime is found to be longer than 10 s at a distance of 40 mu m. This value is an order of magnitude longer than the lifetime of a trap generated by a normal current at the same distance. However, it is many orders of magnitude shorter than the theoretical decay rate induced by the spin-flip transition caused by the fluctuation of the current. This shows that for a type-II superconductor the dominant trap loss mechanism is not the spin-flip transition caused by noise as with a normal current atom trap. An analysis of our measurement suggests that magnetic field distortion resulting from flux penetration into the superconductor leads to much faster decay.

引用

页数：5

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