Plasmon-loss imaging of chains of crystalline-silicon nanospheres and silicon nanowires

被引:21
作者
Kohno, H
Takeda, S
Tanaka, K
机构
[1] Osaka Univ, Grad Sch Sci, Dept Phys, Toyonaka, Osaka 5600043, Japan
[2] Osaka Natl Res Inst, Dept Mat Phys, Ikeda, Osaka 5641155, Japan
来源
JOURNAL OF ELECTRON MICROSCOPY | 2000年 / 49卷 / 02期
关键词
chains of silicon nanospheres; silicon nanowires; energy-filtered TEM; EELS; plasmon-loss imaging; nanostructure;
D O I
10.1093/oxfordjournals.jmicro.a023807
中图分类号
TH742 [显微镜];
学科分类号
摘要
Nanostructures in chains of crystalline-silicon nanospheres and silicon nanowires were investigated using energy-filtered transmission electron microscopy (TEM). Observation of the shape of the silicon nanospheres in the chains provided the direct evidence that the chains were formed via the surface oxidation process, which may preferentially work at the necks. The diverse nanostructures in silicon nanowires were revealed, and we found smooth-shaped wires which have periodically modulated silicon cores. Nanostructures in wire-chain transition regions were also investigated for the first time. The wire-chain transition is not a simple junction of a silicon nanowire and a chain of silicon nanospheres, but has a periodically modulated silicon core in the wire region near the transition position.
引用
收藏
页码:275 / 280
页数:6
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