Automated damage onset analysis techniques applied to KDP damage and the Zeus small area damage test facility

被引:8
作者
Sharp, R [1 ]
Runkel, M [1 ]
机构
[1] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
来源
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1999 | 2000年 / 3902卷
关键词
KDP; bulk damage; automated onset; signal processing; damage detection;
D O I
10.1117/12.379305
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Automated damage testing of KDP using LLNL's Zeus automated damage test system(1) has allowed the statistics of KDP bulk damage to be investigated. Samples are now characterized by the cumulative damage probability curve, or S-curve, that is generated from hundreds of individual test sites per sample. A HeNe laser/PMT scatter diagnostic is used to determine the onset of damage at each test site. The nature of KDP bulk damage is such that each scatter signal may possess many different indicators of a damage event. Because of this, the determination of the initial onset for each scatter trace is not a straightforward affair and has required considerable manual analysis. The amount of testing required by crystal development for the National Ignition Facility (MF) has made it impractical to continue analysis by hand. Because of this, we have developed and implemented algorithms for analyzing the scatter traces by computer. We discuss the signal cleaning algorithms and damage determination criteria that have lead to the successful implementation of a LabView based analysis code. For the typical R/1 damage data set, the program can find the correct damage onset in more than 80% of the cases, with the remaining 20% being left to operator determination. The potential time savings for data analysis is on the order of similar to 100X over manual analysis and is expected to result in the savings of at least 400 man-hours over the next 3 years of NIF quality assurance testing.
引用
收藏
页码:361 / 368
页数:8
相关论文
共 4 条
[1]  
Beauchamp K.G., 1973, SIGNAL PROCESSING US
[2]  
CROCHIERE RE, 1979, PROGRAMS DDIGITALSSI
[3]  
RUNKEL M, 1997, SPIE P, V3244
[4]  
1998, LABVIEW VERSION 4 1