Process analysis and abnormal situation detection: From theory to practice

被引：114

作者：

Kourti, T ^{[1
]}

机构：

[1] McMaster Univ, Dept Chem Engn, McMaster Adv Control Consortium, Hamilton, ON L8S 4L7, Canada

来源：

IEEE CONTROL SYSTEMS MAGAZINE | 2002年 / 22卷 / 05期

关键词：

D O I：

10.1109/MCS.2002.1035214

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

[No abstract available]

引用

页码：10 / 25

页数：16

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