Using NIST crystal data within Siemens software for four-circle and SMART CCD diffractometers

被引：6

作者：

Byram, SK

Campana, CF

Fait, J

Sparks, RA

机构：

来源：

JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | 1996年 / 101卷 / 03期

关键词：

CCD diffractometer; crystallographic databases; database search; four-circle diffractometers; NIST Crystal Data; single crystal structures;

D O I：

10.6028/jres.101.030

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

NIST Crystal Data developed at The National Institute for Standards and Technology has been incorporated with Siemens single crystal software for data collection on four-circle and two-dimensional CCD diffractometers. Why this database is useful in the process of single crystal structure determination, and how the database is searched, are described. Ideas for future access to this and other databases are presented.

引用

收藏

页码：295 / 300

页数：6

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