Reliability estimation for PLC-type optical splitters

被引：11

作者：

Hanafusa, H

Hanawa, F

Hibino, Y

Nozawa, T

机构：

[1] NTT Optoelectronics Laboratories, Tokai, Ibaraki

来源：

ELECTRONICS LETTERS | 1997年 / 33卷 / 03期

关键词：

planar lightwave circuits; optical couplers; reliability; reliability theory;

D O I：

10.1049/el:19970138

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An accelerated lifetest on PLC-tqpe optical splitters is performed in damp heat environments with different temperatures and humidities. The Weibull distribution is used to analyse the times-to-failure of the splitters statistically. The activation energy of the failure is derived as 1.39eV. The hazard rate of the splitters is estimated to be < 0.6 fit over a period of 30 years at 25 degrees C 90% RH.

引用

页码：238 / 239

页数：2

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