Proximity communication

被引:105
作者
Drost, RJ [1 ]
Hopkins, RD [1 ]
Ho, R [1 ]
Sutherland, IE [1 ]
机构
[1] Sun Microsyst Inc, Res Labs, Mountain View, CA 94043 USA
关键词
bandlimited communication; capacitively coupled communication; chip-to-chip communication; CMOS integrated circuit; data communication; mechanical alignment measurement; proximity communication; Vernier measurement;
D O I
10.1109/JSSC.2004.831448
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports results from wireless chip-to-chip communication experiments. Sixteen bit words pass from one chip to another in parallel without detectable error at 1.35 billion data items per second for a total data rate of 21.6 Gigabits per second. The experiment transmits pseudorandom patterns between chips built in a 350-nm CMOS technology. Chips touch face-to-face to communicate. The same pseudorandom data pattern is loaded onto both chips so that the receiving chip can check the accuracy of every bit communicated. Each communication channel consumes a static power of 3.6 mW, and a dynamic power of 3.9 pJ per bit communicated. The channels lie on 50-mum centers. Because the capacitive communication works through covering oxide, ESD protection is unnecessary. Vernier, position measuring circuits built into the chips indicate the relative position of transmitting and receiving arrays to assist mechanical alignment. The test chip includes a Vernier measurement circuit that provides inter-chip position measurements with a resolution of 1.4 mum.
引用
收藏
页码:1529 / 1535
页数:7
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