Effects of temperature and r.f. power sputtering on electrical and optical properties of SnO2

被引:25
作者
Hamzaoui, S [1 ]
Adnane, M [1 ]
机构
[1] Univ Sci & Technol Oran, Lab Microscopie Elect, Oran, Algeria
关键词
D O I
10.1016/S0306-2619(99)00045-8
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Electrical and optical properties of SnO2, which is a photovoltaic material for solar energy conversion to electricity, have been investigated. Semi-conducting SnO2 has been grown by r.f. sputtering. We report the influence of process variables, such as substrate temperature and r.f. power. The film resistivity decreases with increasing temperature, but rises with increasing r.f. power: these can be related to crystallite size and the film orientation respectively. From the optical measurements, we deduce a variation of band-gap energy with substrate temperature. We show that the substrate temperature has a subsequent influence on the electrical and optical properties of this material. (C) 1999 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:19 / 28
页数:10
相关论文
共 8 条
[1]  
[Anonymous], SEMICONDUCTORS
[2]   TRANSPARENT CONDUCTORS - A STATUS REVIEW [J].
CHOPRA, KL ;
MAJOR, S ;
PANDYA, DK .
THIN SOLID FILMS, 1983, 102 (01) :1-46
[3]   OPTICAL AND ELECTRICAL-PROPERTIES OF SNO2 THIN-FILMS IN RELATION TO THEIR STOICHIOMETRIC DEVIATION AND THEIR CRYSTALLINE-STRUCTURE [J].
MANIFACIER, JC ;
DEMURCIA, M ;
FILLARD, JP ;
VICARIO, E .
THIN SOLID FILMS, 1977, 41 (02) :127-135
[4]   SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM [J].
MANIFACIER, JC ;
GASIOT, J ;
FILLARD, JP .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (11) :1002-1004
[5]  
MANIFACIER JC, 1982, THIN SOLID FILMS, V90, P219
[6]   ELECTRON-MICROSCOPY STUDIES OF SPRAYED THIN TIN DIOXIDE FILMS [J].
MELSHEIMER, J ;
TESCHE, B .
THIN SOLID FILMS, 1986, 138 (01) :71-78
[7]   BAND-GAP ENERGY AND URBACH TAIL STUDIES OF AMORPHOUS, PARTIALLY CRYSTALLINE AND POLYCRYSTALLINE TIN DIOXIDE [J].
MELSHEIMER, J ;
ZIEGLER, D .
THIN SOLID FILMS, 1985, 129 (1-2) :35-47
[8]   RESISTIVITY MEASUREMENTS ON GERMANIUM FOR TRANSISTORS [J].
VALDES, LB .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1954, 42 (02) :420-427