Vector diffraction of a grating with conformal thin films

被引:6
作者
Challener, WA
机构
[1] Basic Materials Laboratory, St. Paul, MN, 55144, 3M Center
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1996年 / 13卷 / 09期
关键词
D O I
10.1364/JOSAA.13.001859
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Vector diffraction theory is appropriate whenever the dimensions of the diffracting structures are comparable with the wavelength of the incident light in order to account correctly for polarization effects. If a periodic groove or pit array is coated with a conformal thin-film stack, the diffracting properties of the substrate may be substantially altered. A computationally efficient vector diffraction model for conformal thin films on a biaxial grating is described that does not require coordinate transformations of Maxwell's equations. Calculated results are compared with other published work on diffraction anomalies and with experimental measurements on a rewritable optical disk. (C) 1996 Optical Society of America.
引用
收藏
页码:1859 / 1869
页数:11
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