Optical properties of PZT 65/35 thin films deposited by sol-gel

被引：17

作者：

Boerasu, I ^{[1
]}

Vasilevskiy, MI ^{[1
]}

Pereira, M ^{[1
]}

Costa, MF ^{[1
]}

Gomes, MJM ^{[1
]}

机构：

[1] Univ Minho, Phys Ctr, P-4710057 Braga, Portugal

来源：

FERROELECTRICS | 2002年 / 268卷

关键词：

PZT films; dielectric function; optical properties;

D O I：

10.1080/00150190211063

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

PZT 65/35 thin films were deposited on Pt-coated Si (100) and MgO (110) substrates using the sol-gel technique. The crystalline structure of the films was investigated by X-ray diffraction and Raman spectroscopy. Results of measurements and modeling of the optical spectra for the PZT films on MgO substrates are reported. The effective dielectric function is calculated versus frequency and Gaussian tail of the join density of states under the assumption of direct band to band transition.

引用

页码：187 / 192

页数：6

共 10 条

[1]

Boerasu I, 2000, J OPTOELECTRON ADV M, V2, P602

[2] Surface inspection by an optical triangulation method [J].