Deflection and maximum load of microfiltration membrane sieves made with silicon micromachining

被引:87
作者
vanRijn, C
vanderWekken, M
Nijdam, W
Elwenspoek, M
机构
[1] MESA Research Institute, Department of Electrical Engineering, University of Twente
[2] MESA Research Institute, University of Twente
[3] Freie Universität, Berlin
[4] Micromechanics Department, University of Twente
关键词
filtration membranes; micro filtration; membrane filtration; membrane strength; membrane deflection;
D O I
10.1109/84.557530
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the use of silicon micromachining, an inorganic membrane sieve for microfiltration has been constructed having a silicon nitride membrane layer with thickness typically 1 mu m and perforations typically between 0.5 mu m and 10 mu m in diameter. As a support a [100]-silicon wafer with openings of 1000 mu m in diameter has been used. The thin silicon nitride layer is deposited on an initially dense support by means of a suitable chemical vapor deposition method (LPCVD). Perforations in the membrane layer are obtained with use of standard photo lithography and reactive ion etching (RIE). The deflection and maximum load of the membrane sieves are calculated in a first approximation. Experiments to measure the maximum load of silicon-rich silicon nitride membranes have confirmed this approximation.
引用
收藏
页码:48 / 54
页数:7
相关论文
共 10 条
[1]  
BOUWSTRA S, 1990, SENSORS ACTUATOR MAR
[2]  
BYNUM D, 1992, WELDING RES COUNCIL, V80
[3]  
CHAN KK, 1991, AM CERAM SOC BULL, V70, P703
[4]  
CHIA CY, 1980, NONLINEAR ANAL PLATE, pCH2
[5]  
DIGIOVANNI MP, FLAT CORRUGATED DIAP, pCH14
[6]  
HESCHEL M, 1995, P MME 95 COP DENM SE, P84
[7]  
PORTER I, 1990, HDB IND MEMBRANE TEC
[8]  
SMOLDERS CA, 1992, MEMBR P INDO WKSHP N
[9]  
Spiering V. L., 1993, Journal of Micromechanics and Microengineering, V3, P243, DOI 10.1088/0960-1317/3/4/020
[10]  
TIMOSHENKO SP, 1959, THEORY PLATES SHELLS, pCH1