Fast reconnection in high-Lundquist-number plasmas due to the plasmoid Instability

被引：452

作者：

Bhattacharjee, A. ^{[1
]}

Huang, Yi-Min ^{[1
]}

Yang, H. ^{[2
]}

Rogers, B. ^{[2
]}

机构：

[1] Univ New Hampshire, Ctr Integrated Computat & Anal Reconnect & Turbul, Durham, NH 03824 USA

[2] Dartmouth Coll, Ctr Integrated Computat & Anal Reconnect & Turbul, Hanover, NH 03825 USA

来源：

PHYSICS OF PLASMAS | 2009年 / 16卷 / 11期

基金：

美国国家科学基金会;

关键词：

MAGNETIC RECONNECTION;

D O I：

10.1063/1.3264103

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Thin current sheets in systems of large size that exceed a critical value of Lundquist number are unstable to a super-Alfvenic tearing instability, referred to hereafter as the plasmoid instability. The scaling of the growth rate of the most rapidly growing plasmoid instability with respect to the Lundquist number is shown to follow from the classical dispersion relation for tearing modes. As a result of this instability. the system realizes a nonlinear reconnection rate that appears to be weakly dependent on the Lundquist number, and larger than the Sweet-Parker rate by nearly an order of magnitude (for the range of Lundquist numbers considered). This regime of fast reconnection is realizable in a dynamic and highly unstable thin current sheet, without requiring the current sheet to be turbulent. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3264103]

引用

页数：5

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