Densification of sol-gel TiO2 very thin films studied by SPR measurements

被引：19

作者：

Plenet, JC

Brioude, A

Bernstein, E

Lequevre, F

Dumas, J

Mugnier, J

机构：

[1] Univ Lyon 1, Dept Phys Mat, CNRS UMR 5586, F-69622 Villeurbanne, France

[2] Univ Lyon 1, Lab PhysicoChim Mat Luminescents, UMR 5620, F-69622 Villeurbanne, France

来源：

OPTICAL MATERIALS | 2000年 / 13卷 / 04期

关键词：

sol-gel; surface plasmon resonance; TiO2;

D O I：

10.1016/S0925-3467(99)00094-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Very thin TiO2 films have been prepared by sol-gel and deposited on a silver layer for Surface Plasmon Resonance (SPR) measurements. Densification of the samples has been studied by determining from SPR measurements the optical index (ranging from 1.68 to 1.92) and thickness (ranging from 1.68 to 1.92 nm) at each step of the annealing procedure. The structure of the layer (amorphous and/or crystalline) has been checked at the final stage of the thermal treatment by High Resolution Transmission Electron Microscopy(HRTEM). (C) 2000 Elsevier Science B.V.. All rights reserved.

引用

页码：411 / 415

页数：5

共 12 条

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Abeles F, 1950, ANN PHYS-PARIS, V5, P596, DOI DOI 10.1051/ANPHYS/195012050596

[2] Up-conversion fluorescence spectroscopy in Er3+:TiO2 planar waveguides prepared by a sol-gel process [J].