Amorphous TiO2 coatings stabilize Si, GaAs, and GaP photoanodes for efficient water oxidation

被引:1174
作者
Hu, Shu [1 ,2 ]
Shaner, Matthew R. [1 ,2 ]
Beardslee, Joseph A. [1 ]
Lichterman, Michael [1 ,2 ]
Brunschwig, Bruce S. [3 ,4 ]
Lewis, Nathan S. [1 ,2 ,3 ,4 ,5 ]
机构
[1] CALTECH, Div Chem & Chem Engn, Pasadena, CA 91125 USA
[2] CALTECH, Joint Ctr Artificial Photosynth, Pasadena, CA 91125 USA
[3] CALTECH, Beckman Inst, Pasadena, CA 91125 USA
[4] CALTECH, Mol Mat Res Ctr, Pasadena, CA 91125 USA
[5] CALTECH, Kavli Nanosci Inst, Pasadena, CA 91125 USA
关键词
OXYGEN EVOLUTION REACTION; ATOMIC LAYER DEPOSITION; SEMICONDUCTOR ELECTRODES; SILICON PHOTOANODES; PHOTOELECTROCHEMICAL BEHAVIOR; HYDROGEN-PRODUCTION; NICKEL-OXIDE; THIN-FILMS; CELLS; PERFORMANCE;
D O I
10.1126/science.1251428
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Although semiconductors such as silicon (Si), gallium arsenide (GaAs), and gallium phosphide (GaP) have band gaps that make them efficient photoanodes for solar fuel production, these materials are unstable in aqueous media. We show that TiO2 coatings (4 to 143 nanometers thick) grown by atomic layer deposition prevent corrosion, have electronic defects that promote hole conduction, and are sufficiently transparent to reach the light-limited performance of protected semiconductors. In conjunction with a thin layer or islands of Ni oxide electrocatalysts, Si photoanodes exhibited continuous oxidation of 1.0 molar aqueous KOH to O-2 for more than 100 hours at photocurrent densities of >30 milliamperes per square centimeter and similar to 100% Faradaic efficiency. TiO2-coated GaAs and GaP photoelectrodes exhibited photovoltages of 0.81 and 0.59 V and light-limiting photocurrent densities of 14.3 and 3.4 milliamperes per square centimeter, respectively, for water oxidation.
引用
收藏
页码:1005 / 1009
页数:5
相关论文
共 30 条
[1]   Hole-blocking titanium-oxide/silicon heterojunction and its application to photovoltaics [J].
Avasthi, Sushobhan ;
McClain, William E. ;
Man, Gabriel ;
Kahn, Antoine ;
Schwartz, Jeffrey ;
Sturm, James C. .
APPLIED PHYSICS LETTERS, 2013, 102 (20)
[2]   Titanium dioxide (TiO2)-based gate insulators [J].
Campbell, SA ;
Kim, HS ;
Gilmer, DC ;
He, B ;
Ma, T ;
Gladfelter, WL .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1999, 43 (03) :383-392
[3]  
Chen YW, 2011, NAT MATER, V10, P539, DOI [10.1038/NMAT3047, 10.1038/nmat3047]
[4]   EFFECT OF COPRECIPITATED METAL-IONS ON THE ELECTROCHEMISTRY OF NICKEL-HYDROXIDE THIN-FILMS - CYCLIC VOLTAMMETRY IN 1M KOH [J].
CORRIGAN, DA ;
BENDERT, RM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (03) :723-728
[5]   THE PHOTOCURRENT-VOLTAGE CHARACTERISTICS OF THE HETEROJUNCTION COMBINATION N-SI/SNO2/REDOX-ELECTROLYTE [J].
DECKER, F ;
FRACASTORODECKER, M ;
BADAWY, W ;
DOBLHOFER, K ;
GERISCHER, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (11) :2173-2179
[6]   A comparative study of the electrical properties of TiO2 films grown by high-pressure reactive sputtering and atomic layer deposition [J].
Dueñas, S ;
Castán, H ;
García, H ;
San Andrés, E ;
Toledano-Luque, M ;
Mártil, I ;
González-Díaz, G ;
Kukli, K ;
Uustare, T ;
Aarik, J .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2005, 20 (10) :1044-1051
[7]   SEMICONDUCTOR ELECTRODES .39. TECHNIQUES FOR STABILIZATION OF N-SILICON ELECTRODES IN AQUEOUS-SOLUTION PHOTOELECTROCHEMICAL CELLS [J].
FAN, FRF ;
WHEELER, BL ;
BARD, AJ ;
NOUFI, RN .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (09) :2042-2045
[8]   SEMICONDUCTOR ELECTRODES .48. PHOTO-OXIDATION OF HALIDES AND WATER ON N-SILICON PROTECTED WITH SILICIDE LAYERS [J].
FAN, FRF ;
KEIL, RG ;
BARD, AJ .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1983, 105 (02) :220-224
[9]   Interfacial electron transfer between Fe(II)(CN)64- and TiO2 nanoparticles:: Direct electron injection and nonexponential recombination [J].
Ghosh, HN ;
Asbury, JB ;
Weng, YX ;
Lian, TQ .
JOURNAL OF PHYSICAL CHEMISTRY B, 1998, 102 (50) :10208-10215
[10]   Comparison of the Photoelectrochemical Behavior of H-Terminated and Methyl-Terminated Si(111) Surfaces in Contact with a Series of One-Electron, Outer-Sphere Redox Couples in CH3CN [J].
Grimm, Ronald L. ;
Bierman, Matthew J. ;
O'Leary, Leslie E. ;
Strandwitz, Nicholas C. ;
Brunschwig, Bruce S. ;
Lewis, Nathan S. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2012, 116 (44) :23569-23576