Refraction contrast in X-ray imaging

被引：32

作者：

Keyriläinen, J ^{[1
]}

Fernández, M ^{[1
]}

Suortti, P ^{[1
]}

机构：

[1] Univ Helsinki, Dept Phys, FIN-00014 Helsinki, Finland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2002年 / 488卷 / 1-2期

基金：

芬兰科学院;

关键词：

X-ray refractive index; diffraction-enhanced imaging; two-crystal diffractometer;

D O I：

10.1016/S0168-9002(02)00442-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A two-crystal diffractometer in the non-dispersive configuration is used for measurement of the effects of refraction in weakly absorbing test objects. Characteristic Kalpha(1) radiation from a fine-focus X-ray tube with Mo anode is used. The probing beam is about 70 mum wide and 3 mm high. The sample is placed between the monochromator and analyzer, and it is scanned through the beam. The analyzer is tuned to reflect at the low-angle slope, at the top, or at the high-angle slope of the rocking curve, when the sample is not in the beam. Refraction changes the angle of incidence on the analyzer causing changes in intensity. The observed intensity distributions are exactly reproduced by a calculation, where only the effects of refraction are included. The effects of in-beam interference are negligible or very small, which is also verified by changing the distance between the object and the detector. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：419 / 427

页数：9

共 14 条

[1]

BASHUEV VA, 1996, CRYSTALLOGR REP, V41, P766

[2] AN X-RAY INTERFEROMETER WITH LONG SEPARATED INTERFERING BEAM PATHS (E) [J].

BONSE, U ;

HART, M .

APPLIED PHYSICS LETTERS, 1965, 7 (04) :99-&

[3] Diffraction enhanced x-ray imaging [J].

Chapman, D ;

Thomlinson, W ;

Johnston, RE ;

Washburn, D ;

Pisano, E ;

Gmur, N ;

Zhong, Z ;

Menk, R ;

Arfelli, F ;

Sayers, D .

PHYSICS IN MEDICINE AND BIOLOGY, 1997, 42 (11) :2015-2025

[4] X-RAY IMAGE-CONTRAST FROM A SIMPLE PHASE OBJECT [J].

DAVIS, TJ ;

GUREYEV, TE ;

GAO, D ;

STEVENSON, AW ;

WILKINS, SW .

PHYSICAL REVIEW LETTERS, 1995, 74 (16) :3173-3176

[5] X-RAY PLANE-WAVE TOPOGRAPHY OBSERVATION OF THE PHASE-CONTRAST FROM A NONCRYSTALLINE OBJECT [J].

INGAL, VN ;

BELIAEVSKAYA, EA .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (11) :2314-2317

[6]

James R.W., 1962, OPTICAL PRINCIPLES D

[7] DEMONSTRATION OF PHASE-CONTRAST X-RAY COMPUTED-TOMOGRAPHY USING AN X-RAY INTERFEROMETER [J].

MOMOSE, A .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 352 (03) :622-628

[8] Contrast and resolution in imaging with a microfocus x-ray source [J].

Pogany, A ;

Gao, D ;

Wilkins, SW .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (07) :2774-2782

[9]

SCHWARZCHILD MM, 1928, PHYS REV, V31, P162

[10] On the possibilities of x-ray phase contrast microimaging by coherent high-energy synchrotron radiation [J].

Snigirev, A ;

Snigireva, I ;

Kohn, V ;

Kuznetsov, S ;

Schelokov, I .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (12) :5486-5492

← 1 2 →