Friction of ice measured using lateral force microscopy

被引:43
作者
Bluhm, H [1 ]
Inoue, T [1 ]
Salmeron, M [1 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
关键词
D O I
10.1103/PhysRevB.61.7760
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The friction of nanometer thin ice films grown on mica substrates is investigated using atomic force microscopy (AFM). Friction was found to be of similar magnitude as the static friction of ice reported in macroscopic experiments. The possible existence of a lubricating film of water due to pressure melting, frictional heating, and surface premelting is discussed based on the experimental results using noncontact, contact, and lateral force microscopy. We conclude that AFM measures the dry friction of ice due to the low scan speed and the squeezing out of the water layer between the sharp AFM tip and the ice surface.
引用
收藏
页码:7760 / 7765
页数:6
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