Scanning force microscopy characterization of an elaidic acid monolayer prepared on a terbium-containing subphase

被引：7

作者：

Derue, V

Alexandre, S

Valleton, JM

机构：

[1] URA 500 CNRS, UFR des Sciences, Université de ROUEN

来源：

LANGMUIR | 1996年 / 12卷 / 15期

关键词：

D O I：

10.1021/la9600311

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

[No abstract available]

引用

页码：3740 / 3742

页数：3

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