Submicron-resolution ablation with a KrF excimer laser beam patterned with a projection lens

被引:13
作者
Weisbuch, F
Lazare, S
Goodall, FN
Débarre, D
机构
[1] Univ Bordeaux 1, Lab Physicochim Mol, UMR 5803 CNRS, F-33405 Talence, France
[2] Rutherford Appleton Lab, CCLRC, Cent Microstruct Facil, Didcot OX11 0QX, Oxon, England
[3] Univ Paris 11, Inst Elect Fondamentale, UMR8622, F-91405 Orsay, France
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1999年 / 69卷 / Suppl 1期
关键词
D O I
10.1007/s003390051428
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A mask projection system working with KrF laser radiation is described. This system produces microscopic laser beams able to pattern gratings on the surface of various materials in the micrometer range by direct etching. Models have been developed to simulate the beam intensity profile on the sample. Various polymers have been irradiated, and their experimental profiles are compared with theoretical ones. Different ablation behaviors have been evidenced. Interesting consequences of thermal effects at this submicron scale are reported.
引用
收藏
页码:S413 / S417
页数:5
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