First-principles calculations of ELNES and XANES of selected wide-gap materials: Dependence on crystal structure and orientation

被引:169
作者
Mizoguchi, T
Tanaka, I
Yoshioka, S
Kunisu, M
Yamamoto, T
Ching, WY
机构
[1] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
[2] Kyoto Univ, Fukui Inst Fundamental Chem, Sakyo Ku, Kyoto 6068103, Japan
[3] Univ Missouri, Dept Phys, Kansas City, MO 64110 USA
来源
PHYSICAL REVIEW B | 2004年 / 70卷 / 04期
基金
日本学术振兴会;
关键词
D O I
10.1103/PhysRevB.70.045103
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Theoretical calculations of electron energy-loss near-edge structure (ELNES) and x-ray absorption near-edge structure (XANES) of selected wide-gap materials including TiO2, AlN, GaN, InN, ZnO, and their polymorphs are performed using a first-principles method. Calculations of 39 K and L-3(L-2,L-3) edges are made using large supercells containing 72 to 128 atoms. A core hole is included in the final state, and the matrix elements of the electric dipole transition between the ground state and the final state are computed. Structures of some metastable crystals are optimized by a plane-wave basis pseudopotential method. Spectral differences in ELNES and XANES among polymorphs are quantitatively reproduced in this way. The origin of the spectral differences is pursued from the viewpoint of chemical bondings. Crystallographic orientation dependence of ELNES and XANES is also examined both by experiment and theory. The dependence is found to be much larger in K edges than that in L-3(L-2,L-3) edges.
引用
收藏
页码:045103 / 1
页数:10
相关论文
共 65 条
[1]   REMEASUREMENT OF STRUCTURE OF HEXAGONAL ZNO [J].
ABRAHAMS, SC ;
BERNSTEIN, JL .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY, 1969, B 25 :1233-+
[2]   Visible-light photocatalysis in nitrogen-doped titanium oxides [J].
Asahi, R ;
Morikawa, T ;
Ohwaki, T ;
Aoki, K ;
Taga, Y .
SCIENCE, 2001, 293 (5528) :269-271
[3]   NEW HIGH-PRESSURE POLYMORPH OF ZINC OXIDE [J].
BATES, CH ;
ROY, R ;
WHITE, WB .
SCIENCE, 1962, 137 (3534) :993-&
[4]  
BEAURDEN JA, 1967, REV MOD PHYS, V39, P125
[5]   EELS in the STEM: Determination of materials properties on the atomic scale [J].
Browning, ND ;
Wallis, DJ ;
Nellist, PD ;
Pennycook, SJ .
MICRON, 1997, 28 (05) :333-348
[6]   ELECTRON-ENERGY LOSS AND X-RAY ABSORPTION-SPECTROSCOPY OF RUTILE AND ANATASE - A TEST OF STRUCTURAL SENSITIVITY [J].
BRYDSON, R ;
SAUER, H ;
ENGEL, W ;
THOMAS, JM ;
ZEITLER, E ;
KOSUGI, N ;
KURODA, H .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (04) :797-812
[7]   CHARACTERIZATION OF GROUP-III NITRIDE SEMICONDUCTORS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
CHANDRASEKHAR, D ;
SMITH, DJ ;
STRITE, S ;
LIN, ME ;
MORKOC, H .
JOURNAL OF CRYSTAL GROWTH, 1995, 152 (03) :135-142
[8]   Crystal orientation dependence of optical gain in InGaN/GaN multiple-quantum-well structures [J].
Chen, CC ;
Hsieh, KL ;
Sheu, JK ;
Chi, GC ;
Jou, MJ ;
Lee, CH ;
Lin, MZ .
APPLIED PHYSICS LETTERS, 2001, 79 (10) :1477-1479
[9]   THEORETICAL-STUDIES OF THE ELECTRONIC-PROPERTIES OF CERAMIC MATERIALS [J].
CHING, WY .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1990, 73 (11) :3135-3160
[10]  
Ching WY, 2002, J AM CERAM SOC, V85, P11, DOI 10.1111/j.1151-2916.2002.tb00030.x