Phase transformations inWO3 thin films during annealing

被引:126
作者
Al Mohammad, A
Gillet, M
机构
[1] Univ Aix Marseille 3, UMR CNRS, Fac Sci St Jerome, Lab Mat & Microelect Provence, F-13397 Marseille 20, France
[2] AECS, Damascus, Syria
关键词
atomic force microscopy (AFM); oxides; phase transitions; transmission electron microscopy (TEM);
D O I
10.1016/S0040-6090(02)00090-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
WO3 thin films have been annealed in air in the temperature range 20-450 degreesC and the changes in grain size and crystallographic structure have been investigated as a function of the annealing conditions. During annealing, important changes in grain size and structure occur and have been characterised by electron microscopy and electron diffraction. As the annealing temperature increases, the monoclinic structure successively transforms to WO3.1/3 H2O phase, hexagonal WO3, WO3-x (Magneli phases) and monoclinic WO3. The formation of WO3-x was only observed when the thin film was annealed on its substrate. This nonstoichiometric WO3-x phase exhibits specific fringe contrast imaging of well-ordered crystallographic shear planes. The most frequent Magneli phase we have observed corresponds to the W40O118 is structure. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:302 / 309
页数:8
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