Whispering-gallery mode technique applied to the measurement of the dielectric properties of langasite between 4 K and 300 K

We report new measurements of dielectric properties of Lanthanum gallium silicate (Langasite or LGS) conducted with the whispering-gallery mode technique at microwave frequencies and between 4.2 K and 300 K. The real part of the permittivity tenser of LGS presents two components having temperature coefficients of opposite sign. This unique property enables the design of a temperature compensated resonator that may be useful in building stable microwave oscillators or filters. We report also the first measurements of the two independent components of the imaginary part of the permittivity tenser. It appears LGS is a relatively high-loss dielectric material compared with sapphire or quartz.