The effect of edge roughness on magnetization reversal in micron-sized permalloy thin films

被引:32
作者
Deak, JG [1 ]
Koch, RH [1 ]
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
关键词
magnetic films; micromagnetics; edge roughness; hysteresis; switching;
D O I
10.1016/S0304-8853(99)00603-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of edge roughness on the reproducibility of hysteresis loops and the magnetization reversal time of rectangular micron-sized permalloy thin films was studied using a dynamic micromagnetic simulation. Edge roughness was found to change the local equilibrium magnetization patterns, and the transition between these local equilibrium magnetization patterns was shown to induce steps in the hysteresis loops and to strongly affect the magnetization reversal time. In rectangular films, fast magnetization reversals and clean hysteresis loops are more likely to result when N-type magnetization patterns are stable in positive and negative saturation. A rough estimate of the hard-axis bias field required to eliminate edge-roughness-induced irreproducibility was determined. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:25 / 31
页数:7
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