Near-field optical images of ordered polystyrene particle layers and their photonic band effect

被引：15

作者：

Fujimura, T

Itoh, T

Imada, A

Shimada, R

Koda, T

Chiba, N

Muramatsu, H

Miyazaki, H

Ohtaka, K

机构：

[1] Osaka Univ, Grad Sch Engn Sci, Dept Phys Sci, Toyonaka, Osaka 5608531, Japan

[2] Japan Womens Univ, Dept Math & Phys Sci, Bunkyo Ku, Tokyo 1128681, Japan

[3] Seiko Instruments Inc, Matsudo, Chiba 2702222, Japan

[4] Tohoku Univ, Dept Appl Phys, Aoba Ku, Sendai, Miyagi 9808579, Japan

[5] Chiba Univ, Dept Appl Phys, Inage Ku, Chiba 2638522, Japan

来源：

JOURNAL OF LUMINESCENCE | 2000年 / 87-9卷

基金：

日本学术振兴会;

关键词：

near-field; scanning near-field microscope; photonic crystals; photonic bands;

D O I：

10.1016/S0022-2313(99)00487-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

To study the origin of the SNOM image contrast patterns observed for samples composed of transparent materials only, we have investigated the transmission SNOM images of an ordered polystyrene particles layer for Various wavelengths of incident light. We have found a drastic change in the SNOM image patterns as the incident wavelength is scanned across the resonant wavelength of the photonic bands of the layer. Observed wavelength dependence of the near-field intensity of the layer was found to be in a good qualitative agreement with the theoretical calculation in terms of the photonic band effect. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：954 / 956

页数：3

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