PIXE and ToF-SIMS analysis of streaker samplers filters

被引:11
作者
D'Alessandro, A
Nava, S
Van Ham, R
Adriaens, A
Lucarelli, F
Marcazzan, G
Prati, P
Valli, G
Vecchi, R
Zucchiatti, A
机构
[1] Univ Genoa, Dipartimento Fis, Genoa, Italy
[2] Univ Genoa, INFN, Genoa, Italy
[3] Univ Antwerp, Dept Chem, B-2610 Antwerp, Belgium
[4] State Univ Ghent, Dept Analyt Chem, B-9000 Ghent, Belgium
[5] Univ Florence, Dipartimento Fis, I-50125 Florence, Italy
[6] Univ Florence, INFN, I-50125 Florence, Italy
[7] Univ Milan, Ist Fis Gen Applicata, I-20133 Milan, Italy
[8] Univ Milan, INFN, I-20133 Milan, Italy
[9] Univ Milan, Ist Fis Gen Applicata, I-20133 Milan, Italy
[10] Univ Milan, INFN, I-20133 Milan, Italy
关键词
particulate matter; PIXE; ToF-SIMS; streaker sampler; urban pollution;
D O I
10.1016/j.nimb.2004.02.014
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The paper presents methodological innovations introduced in the characterisation of urban aerosol collected in Italy in a recent campaign. Two complementary ion beam analysis (IBA) techniques were used to analyse Nuclepore filters used in continuous streaker samplers to collect airborn particles in four Italian towns. Na to Pb elemental concentrations were obtained by particle induced X-ray emission (PIXE), while time of flight secondary ion mass spectrometry (ToF-SIMS) produced, on the same samples, time trends for several elements and molecular fragments. In addition, light attenuation measurements were used as a tracer for black carbon. The data produced by these three techniques was merged into a unique data set to address the characterisation of particulate matter sources. Correlations between elemental concentration trends (PIXE) and relative trends for molecular fragments (ToF-SIMS) and black carbon (light attenuation) have been studied by cluster and principal component analysis. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:261 / 269
页数:9
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