Secondary fluorescence correction formulae for X-ray microanalysis .2. Self-supporting discs

被引:4
作者
Anderson, IM [1 ]
Bentley, J [1 ]
Carter, CB [1 ]
机构
[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455
基金
美国国家科学基金会;
关键词
X-ray microanalysis;
D O I
10.1016/S0304-3991(97)00016-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
Geometric factors are derived for correction of secondary fluorescence from self-supporting thinned discs. Fluorescence is considered both when the entire 3 mm disc is exposed to the X-ray detector and when the majority of the specimen is masked by an X-ray opaque washer with a small circular aperture. Geometric factors can be expressed as a ratio of the lengths that characterize fluorescence from these discs. The geometric factors seldom exceed a few percent because self-supporting discs subtend small fractional solid angles from the perspective of the thin edge being analyzed. However, elements composing the disc are fluoresced with equal efficiency by all primary X-rays of energy higher than the ionization energy of the fluoresced element. Fluorescence of self-supporting discs is therefore qualitatively different from fluorescence of parallel-sided thin foils, wedges, and bulk specimens, for which substantial fluorescence occurs only when the energy of the fluorescing primary X-ray barely exceeds the ionization energy of the fluoresced element.
引用
收藏
页码:95 / 107
页数:13
相关论文
共 5 条
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