Charge fluctuations and image potential at oxide-metal interfaces

被引：19

作者：

Altieri, S

Tjeng, LH

Voogt, FC

Hibma, T

Rogojanu, O

Sawatzky, GA

机构：

[1] Univ Groningen, Ctr Mat Sci, Solid State Phys Lab, NL-9747 AG Groningen, Netherlands

[2] INFM, Natl Ctr Nanostruct & Biosyst Surfaces S3, I-41100 Modena, Italy

[3] Univ Cologne, Inst Phys 2, D-50937 Cologne, Germany

[4] Univ Groningen, Ctr Mat Sci, Chem Phys Lab, NL-9747 AG Groningen, Netherlands

[5] Univ British Columbia, Dept Phys & Astron, Vancouver, BC V6T 1Z1, Canada

来源：

PHYSICAL REVIEW B | 2002年 / 66卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.66.155432

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We analyze the dynamical response of the Ag metal surface to electronic excitations in a MgO(100)/Ag(100) oxide-metal interface system. Intrinsic and extrinsic surface plasmon excitations are discussed in relation to mutual interactions between the oxide and the metal. A direct relationship is established between the reduction of charge fluctuation energies in the MgO(100) layers and the image charge screening by the Ag(100) metal surface.

引用

页码：1 / 6

页数：6

共 40 条

[1] Reduction of Coulomb and charge-transfer energies in oxide films on metals [J].