A physical model to predict stiction in MEMS

被引:175
作者
van Spengen, WM
Puers, R
De Wolf, I
机构
[1] IMEC, B-3001 Louvain, Belgium
[2] Katholieke Univ Leuven, EE Dept, B-3001 Heverlee, Belgium
关键词
D O I
10.1088/0960-1317/12/5/329
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One of the most important reliability problems in micro-electromechanical systems (MEMSs) is stiction, the adhesion of contacting surfaces due to surface forces. After reviewing the known physical theory, and the measurement method commonly used to investigate stiction, we present a model that can be used to investigate the sensitivity of MEMS to stiction. It quantitatively predicts the surface interaction energy of surfaces in contact. Included in the model is the roughness of the contacting surfaces and the environmental conditions (humidity and temperature). This is done by describing the surface interaction energy as a function of the distance between the surfaces. This distance is not a unique number, but rather a distribution of distances. It is shown that, if we know this distribution, we can calculate the surface interaction energy. The model is suitable for the prediction of forces due to capillary condensation and molecular interactions.
引用
收藏
页码:702 / 713
页数:12
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