Silicon single-electron devices

被引:131
作者
Takahashi, Y [1 ]
Ono, Y [1 ]
Fujiwara, A [1 ]
Inokawa, H [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan
关键词
D O I
10.1088/0953-8984/14/39/201
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Single-electron devices (SEDs) are attracting a lot of attention because of their capability of manipulating just one electron. For their operation, they utilize the Coulomb blockade (CB), which occurs in tiny structures made from conductive material due to the electrostatic interactions of confined electrons. Metals or III-V compound semiconductors have so far been used to investigate the CB and related phenomena from the physical point of view. However, silicon is preferable from the viewpoint of applications to integrated circuits because, on a silicon substrate, SEDs can be used in combination with conventional complementary metal-oxide-semiconductor (CMOS) circuits. In addition, the well established fabrication technologies for CMOS large-scale integrated circuits (LSIs) can be applied to making such small structures. LSI applications of the silicon SEDs can be categorized into two fields: memory and logic. Many kinds of device structure and fabrication process have been proposed and tested for these purposes. This paper introduces the current status of silicon-based SED studies for LSI applications.
引用
收藏
页码:R995 / R1033
页数:39
相关论文
共 178 条
[1]   Boltzmann machine neuron circuit using single-electron tunneling [J].
Akazawa, M ;
Amemiya, Y .
APPLIED PHYSICS LETTERS, 1997, 70 (05) :670-672
[2]  
Akazawa M, 1999, IEICE T ELECTRON, VE82C, P1607
[3]  
Akazawa M, 1997, IEICE T ELECTRON, VE80C, P849
[4]  
AKERS SB, 1978, IEEE T COMPUT, V27, P509, DOI 10.1109/TC.1978.1675141
[5]   COULOMB-BLOCKADE IN A SILICON TUNNEL JUNCTION DEVICE [J].
ALI, D ;
AHMED, H .
APPLIED PHYSICS LETTERS, 1994, 64 (16) :2119-2120
[6]   Electrical characteristics of two Coulomb blockade devices driven by a periodically oscillating potential [J].
Altebaeumer, T ;
Ahmed, H .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (03) :1350-1356
[7]   Estimation of cotunneling in single-electron logic and its suppression [J].
Amakawa, S ;
Fukui, H ;
Fujishima, M ;
Hoh, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1996, 35 (2B) :1146-1150
[8]  
AMAKAWA S, 1998, IEICE T ELECTRON, V8, pC21
[9]   Design of computationally useful single-electron digital circuits [J].
Ancona, MG .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (01) :526-539
[10]   Single-phase single-electron digital circuits [J].
Ancona, MG .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (07) :3311-3315