Single-event effects in analog and mixed-signal integrated circuits

被引：60

作者：

Turflinger, TL

机构：

[1] NSWC, Crane

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1996年 / 43卷 / 02期

关键词：

D O I：

10.1109/23.490903

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Analog and mixed-signal integrated circuits are also susceptible to single-event effects, but they have rarely been tested. Analog circuit single-particle transients require modified test techniques and data analysis. Existing work is reviewed and future concerns are outlined.

引用

页码：594 / 602

页数：9

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