Multidimensional analysis of trends in patent activity

被引：12

作者：

Doré, JC

Dutheuil, C

Miquel, JF

机构：

[1] Museum Natl Hist Nat, CNRS ESA 8041, Paris 05, France

[2] Soc Francaise Dev Informat & Chim, Aulnay Sous Bois, France

[3] Ecole Cent Paris, Lab Strategie & Technol, F-92295 Chatenay Malabry, France

来源：

SCIENTOMETRICS | 2000年 / 47卷 / 03期

关键词：

D O I：

10.1023/A:1005667800235

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Only multidimensional analyses can provide overviews of complex relationships among many variables. We have previously illustrated the use of Correspondence Factor Analysis (CFA) in the analysis of publication profiles. In this article, we retrace our activity in patent analysis from the late 1970s to the present day and show how CFA is a particularly useful tool not only for describing the correlations between countries and technological Fields but also for highlighting non-linear patenting time trends.

引用

页码：475 / 492

页数：18

共 48 条

[1]

ADLER SF, 1986, RES MANAGE, V19, P29

[2] Knowledge sourcing by foreign multinationals: Patent citation analysis in the US semiconductor industry [J].