The oxidation state of Fe(100) after initial oxidation in O2

被引:246
作者
Roosendaal, SJ [1 ]
van Asselen, B [1 ]
Elsenaar, JW [1 ]
Vredenberg, AM [1 ]
Habraken, FHPM [1 ]
机构
[1] Univ Utrecht, Debye Inst, Sect Interface Phys, NL-3508 TA Utrecht, Netherlands
关键词
ellipsometry; high energy ion scattering; iron; iron oxide; oxidation; oxygen; single crystal surfaces; X-ray photoelectron spectroscopy;
D O I
10.1016/S0039-6028(99)01006-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Using a combination of quantitative X-ray photoelectron spectroscopy (XPS) with the high energy ion beam technique elastic recoil detection (ERD), we focus on the chemical state of thin (a few nanometers) oxide films on Fe(100). We determined quantitatively the amounts of Fe2+ and Fe3+ in the oxide layer formed at room temperature and compared these with the absolute coverages of oxygen determined with ERD. For thin oxide layers (less than or equal to 4.0 x 10(15) O atoms/cm(2) corresponding to 3 ML), the oxide layer grown on Fe(100) consists of Fe2+ mainly, indicating the growth of FeO. Some Fe-0 also seems to be present in the oxide layer. For larger coverages additional Fe atoms in the oxide are in the 3 + state, which is present mainly near the oxide/vacuum interface. Annealing of the double layer system formed or oxidizing at higher temperature leads to an increase of the relative amount of Fe2+. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:329 / 337
页数:9
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